Details
Mixed-Signal Generic Testing in Photonic Integration
Synthesis Lectures on Digital Circuits & Systems
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53,49 € |
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| Verlag: | Springer |
| Format: | |
| Veröffentl.: | 31.07.2024 |
| ISBN/EAN: | 9783031608117 |
| Sprache: | englisch |
| Anzahl Seiten: | 200 |
Dieses eBook enthält ein Wasserzeichen.
Beschreibungen
<p>This book describes testing methods for Novel Photonic Integrated Circuits, which have become one of the hottest topics in the context of information technology. Readers will learn that these objects are used not only to enhance the throughput of optical communications (backbone of the internet network), but also to for smart-sensing, metrology, quantum application and artificial intelligence. The increasing demand for this kind of device drives the need for fast and effective testing methods, as described in this book. </p>
<p>Introduction.- Towards Testing in Integrated Photonics.- The Device Under Test.- Electrical Testing.- Techniques and Methods for Optical Testing.- Mitigation of Nonlinear Effects.- Conclusion.</p>
<p>Matteo Petrini (1995) received the B.Sc in Computer Science and Engineering (summa cum laude) in 2017 the M.Sc in Telecommunication Engineering (summa cum laude) in 2019, and the Ph.D. in Information Technology (summa cum laude) in 2023, always at Politecnico di Milano. During the Ph.D., he was focusing on techniques for automatic tuning and testing of Photonic Integrated Circuits.</p><p>He is now with Cisco Photonics Italy, as HW engineer, handling the NPI (New Projects Introduction) of new Optical Line Cards, from their design to the after-sell troubleshooting.</p><p><br></p>
<p>This book describes testing methods for Novel Photonic Integrated Circuits, which have become one of the hottest topics in the context of information technology. Readers will learn that these objects are used not only to enhance the throughput of optical communications (backbone of the internet network), but also to for smart-sensing, metrology, quantum application and artificial intelligence. The increasing demand for this kind of device drives the need for fast and effective testing methods, as described in this book.</p>
<p>In addition, this book:</p>
<ul>
<li>Includes a unique set of algorithms to test photonic circuits efficiently</li>
<li>Presents methods in a holistic context, including aspects related to testing “ancillary” building blocks</li>
<li>Provides insight into testing of newest photonic integrated circuits being implemented on silicon</li>
</ul>
<p>In addition, this book:</p>
<ul>
<li>Includes a unique set of algorithms to test photonic circuits efficiently</li>
<li>Presents methods in a holistic context, including aspects related to testing “ancillary” building blocks</li>
<li>Provides insight into testing of newest photonic integrated circuits being implemented on silicon</li>
</ul>
Includes a unique set of algorithms to test photonic circuits efficiently Presents methods in a holistic context, including aspects related to testing “ancillary” building blocks Provides insight into testing of newest photonic integrated circuits being implemented on silicon
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