Details

Scanning Force Microscopy


Scanning Force Microscopy

With Applications to Electric, Magnetic, and Atomic Forces
Oxford Series in Optical and Imaging Sciences

von: Dror Sarid

146,88 €

Verlag: Oxford University Press
Format: PDF
Veröffentl.: 25.08.1994
ISBN/EAN: 9780195344691
Sprache: englisch
Anzahl Seiten: 288

DRM-geschütztes eBook, Sie benötigen z.B. Adobe Digital Editions und eine Adobe ID zum Lesen.

Beschreibungen

Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. Scanning Force Microscopy, Revised Edition updates the earlier edition's survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography. Academic and industrial researchers using STM, or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field.

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